Improved quantitative mobility spectrum analysis for hall characterization

Journal of Applied Physics

Volumn 84, Issue 9, 1998, Pages 4966-4973

  Vurgaftman, I ^a   Meyer, J R ^a   Hoffman, C A ^a   Redfern, D ^b   Antoszewski, J ^b   Faraone, L ^b   Lindemuth, J R ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF WESTERN AUSTRALIA   (Australia)

^c Lake Shore Cryotronics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000377727     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368741     Document Type: Article

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12. xy=0.