SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 100, Issue 13, 2012, Pages

Local resistive switching of Nd doped BiFeO 3 thin films

(4) Shen, Wan a Bell, Andrew b Karimi, Sarah a Reaney, Ian M a

a UNIVERSITY OF SHEFFIELD (United Kingdom)

b UNIVERSITY OF LEEDS (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; GRAIN INTERIORS; HIGH-RESISTANCE STATE; ND-DOPED; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS; WHOLE GRAINS;

ATOMIC FORCE MICROSCOPY; GRAIN BOUNDARIES; SWITCHING SYSTEMS; THIN FILMS;

NEODYMIUM;

EID: 84859524017 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3701270 Document Type: Article

Times cited : (30)

References (26)

1
- 77951622926
- 10.1038/nmat2748
- E. Linn, R. Rosezin, C. Kugeler, and R. Waser, Nature Mater. 9, 403 (2010); 10.1038/nmat2748
- (2010) Nature Mater. , vol.9 , pp. 403
- Linn, E.¹ Rosezin, R.² Kugeler, C.³ Waser, R.⁴

2
- 35748974883
- Nanoionics-based resistive switching memories
- DOI 10.1038/nmat2023, PII NMAT2023
- R. Waser and M. Aono, Nature Mater. 6, 833 (2007); 10.1038/nmat2023 (Pubitemid 350064191)
- (2007) Nature Materials , vol.6 , Issue.11 , pp. 833-840
- Waser, R.¹ Aono, M.²

3
- 67650102619
- 10.1002/adma.200900375
- R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 21, 2632 (2009). 10.1002/adma.200900375
- (2009) Adv. Mater. , vol.21 , pp. 2632
- Waser, R.¹ Dittmann, R.² Staikov, G.³ Szot, K.⁴

4
- 33645641019
- 10.1038/nmat1614
- K. Szot, W. Speier, G. Bihlmayer, and R. Waser, Nature Mater. 5, 312 (2006). 10.1038/nmat1614
- (2006) Nature Mater. , vol.5 , pp. 312
- Szot, K.¹ Speier, W.² Bihlmayer, G.³ Waser, R.⁴

5
- 2942548117
- 10.1103/PhysRevLett.92.178302
- M. J. Rozenberg, I. H. Inoue, and M. J. Snchez, Phys. Rev. Lett. 92, 178302 (2004). 10.1103/PhysRevLett.92.178302
- (2004) Phys. Rev. Lett. , vol.92 , pp. 178302
- Rozenberg, M.J.¹ Inoue, I.H.² Snchez, M.J.³

6
- 79951604400
- 10.1039/c0nr00580k
- M. H. Lee and C. S. Hwang, Nanoscale 3, 490 (2011); 10.1039/c0nr00580k
- (2011) Nanoscale , vol.3 , pp. 490
- Lee, M.H.¹ Hwang, C.S.²

7
- 79251497987
- 10.1063/1.3369285
- W. Shen, R. Dittmann, and R. Waser, J. Appl. Phys. 107, 094506 (2010). 10.1063/1.3369285
- (2010) J. Appl. Phys. , vol.107 , pp. 094506
- Shen, W.¹ Dittmann, R.² Waser, R.³

8
- 23944447615
- 2 thin films grown by atomic-layer deposition
- DOI 10.1063/1.2001146, 033715
- B. J. Choi, D. S. Jeong, S. K. Kim, C. Rohde, S. Choi, J. H. Oh, H. J. Kim, C. S. Hwang, K. Szot, R. Waser, B. Reichenberg, and S. Tiedke, J. Appl. Phys. 98, 033715 (2005). 10.1063/1.2001146 (Pubitemid 41204789)
- (2005) Journal of Applied Physics , vol.98 , Issue.3 , pp. 1-10
- Choi, B.J.¹ Jeong, D.S.² Kim, S.K.³ Rohde, C.⁴ Choi, S.⁵ Oh, J.H.⁶ Kim, H.J.⁷ Hwang, C.S.⁸ Szot, K.⁹ Waser, R.¹⁰ Reichenberg, B.¹¹ Tiedke, S.¹²

9
- 34548263330
- Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films
- DOI 10.1063/1.2769759
- C. B. Lee, B. S. Kang, M. J. Lee, S. E. Ahn, G. Stefanovich, W. X. Xianyu, K. H. Kim, J. H. Hur, H. X. Yin, Y. Park, and I. K. Yoo, Appl. Phys. Lett. 91, 082104 (2007). 10.1063/1.2769759 (Pubitemid 47318956)
- (2007) Applied Physics Letters , vol.91 , Issue.8 , pp. 082104
- Lee, C.B.¹ Kang, B.S.² Lee, M.J.³ Ahn, S.E.⁴ Stefanovich, G.⁵ Xianyu, W.X.⁶ Kim, K.H.⁷ Hur, J.H.⁸ Yin, H.X.⁹ Park, Y.¹⁰ Yoo, I.K.¹¹ Park, J.-B.¹² Park, B.H.¹³

10
- 37549046069
- 10.1063/1.2802990
- C. Y. Lin, C. Y. Wu, C. Y. Wu, T. Y. Tseng, and C. Hu, J. Appl. Phys. 102, 094101 (2007). 10.1063/1.2802990
- (2007) J. Appl. Phys. , vol.102 , pp. 094101
- Lin, C.Y.¹ Wu, C.Y.² Wu, C.Y.³ Tseng, T.Y.⁴ Hu, C.⁵

11
- 0001331485
- 10.1063/1.126902
- A. Beck, J. G. Bednorz, Ch. Gerber, C. Rossel, and D. Widmer, Appl. Phys. Lett. 77, 139 (2000). 10.1063/1.126902
- (2000) Appl. Phys. Lett. , vol.77 , pp. 139
- Beck, A.¹ Bednorz, J.G.² Gerber, Ch.³ Rossel, C.⁴ Widmer, D.⁵

12
- 57349121100
- 10.1063/1.3039809
- W. Shen, R. Dittmann, U. Breuer, and R. Waser, Appl. Phys. Lett. 93, 222102 (2008). 10.1063/1.3039809
- (2008) Appl. Phys. Lett. , vol.93 , pp. 222102
- Shen, W.¹ Dittmann, R.² Breuer, U.³ Waser, R.⁴

13
- 0000748226
- 10.1063/1.126464
- S. Q. Liu, N. J. Wu, and A. Ignatiev, Appl. Phys. Lett. 76, 2749 (2000). 10.1063/1.126464
- (2000) Appl. Phys. Lett. , vol.76 , pp. 2749
- Liu, S.Q.¹ Wu, N.J.² Ignatiev, A.³

14
- 0037436499
- 3 multiferroic thin film heterostructures
- DOI 10.1126/science.1080615
- J. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh, Science 299, 1719 (2003). 10.1126/science. 1080615 (Pubitemid 36337195)
- (2003) Science , vol.299 , Issue.5613 , pp. 1719-1722
- Wang, J.¹ Neaton, J.B.² Zheng, H.³ Nagarajan, V.⁴ Ogale, S.B.⁵ Liu, B.⁶ Viehland, D.⁷ Vaithyanathan, V.⁸ Schlom, D.G.⁹ Waghmare, U.V.¹⁰ Spaldin, N.A.¹¹ Rabe, K.M.¹² Wuttig, M.¹³ Ramesh, R.¹⁴

15
- 77955725082
- 10.1063/1.3467838
- K. B. Yin, M. Li, Y. W. Liu, C. L. He, F. Zhuge, B. Chen, W. Lu, X. Q. Pan, and R. W. Li, Appl. Phys. Lett. 97, 042101 (2010). 10.1063/1.3467838
- (2010) Appl. Phys. Lett. , vol.97 , pp. 042101
- Yin, K.B.¹ Li, M.² Liu, Y.W.³ He, C.L.⁴ Zhuge, F.⁵ Chen, B.⁶ Lu, W.⁷ Pan, X.Q.⁸ Li, R.W.⁹

16
- 79952403920
- 10.1002/adma.201004317
- A. Q. Jiang, C. Wang, K. J. Jin, X. B. Liu, J. F. Scott, C. S. Hwang, T. A. Tang, H. B. Lu, and G. Z. Yang, Adv. Mater. 23, 1277 (2011). 10.1002/adma.201004317
- (2011) Adv. Mater. , vol.23 , pp. 1277
- Jiang, A.Q.¹ Wang, C.² Jin, K.J.³ Liu, X.B.⁴ Scott, J.F.⁵ Hwang, C.S.⁶ Tang, T.A.⁷ Lu, H.B.⁸ Yang, G.Z.⁹

17
- 79959342891
- 10.1007/s00339-011-6266-7
- M. H. Lee, K. M. Kim, S. J. Song, S. H. Rha, J. Y. Seok, J. S. Jung, G. H. Kim, J. H. Yoon, and C. S. Hwang, Appl. Phys. A. 102, 827 (2011). 10.1007/s00339-011-6266-7
- (2011) Appl. Phys. A. , vol.102 , pp. 827
- Lee, M.H.¹ Kim, K.M.² Song, S.J.³ Rha, S.H.⁴ Seok, J.Y.⁵ Jung, J.S.⁶ Kim, G.H.⁷ Yoon, J.H.⁸ Hwang, C.S.⁹

18
- 35248862247
- 3 thin films
- DOI 10.1002/pssr.200701003
- K. Szot, R. Dittmann, W. Speier, and R. Waser, Phys. Status Solidi (RRL) 1, R86 (2007). 10.1002/pssr.200701003 (Pubitemid 351175977)
- (2007) Physica Status Solidi - Rapid Research Letetrs , vol.1 , Issue.2
- Szot, K.¹ Dittmann, R.² Speier, W.³ Waser, R.⁴

19
- 44849088973
- 10.1063/1.2931087
- J. Y. Son and Y. H. Shin, Appl. Phys. Lett. 92, 222106 (2008). 10.1063/1.2931087
- (2008) Appl. Phys. Lett. , vol.92 , pp. 222106
- Son, J.Y.¹ Shin, Y.H.²

20
- 49149127469
- 10.1063/1.2966141
- C. Yoshida, K. Kinoshita, T. Yamasaki, and Y. Sugiyama, Appl. Phys. Lett. 93, 042106 (2008). 10.1063/1.2966141
- (2008) Appl. Phys. Lett. , vol.93 , pp. 042106
- Yoshida, C.¹ Kinoshita, K.² Yamasaki, T.³ Sugiyama, Y.⁴

21
- 0025448039
- 10.1111/j.1151-2916.1990.tb09809.x
- R. Waser, T. Baiatu, and K.-H. Haerdtl, J. Am. Ceram. Soc. 73, 1645 (1990). 10.1111/j.1151-2916.1990.tb09809.x
- (1990) J. Am. Ceram. Soc. , vol.73 , pp. 1645
- Waser, R.¹ Baiatu, T.² Haerdtl, K.-H.³

22
- 27744499748
- Electrical properties of the grain boundaries of oxygen ion conductors: Acceptor-doped zirconia and ceria
- DOI 10.1016/j.pmatsci.2005.07.001, PII S0079642505000332
- X. Guo and R. Waser, Prog. Mater. Sci. 51, 151 (2006). 10.1016/j.pmatsci.2005.07.001 (Pubitemid 41613864)
- (2006) Progress in Materials Science , vol.51 , Issue.2 , pp. 151-210
- Guo, X.¹ Waser, R.²

23
- 1842581494
- 10.1063/1.1667612
- Y. P. Wang, L. Zhou, M. F. Zhang, X. Y. Chen, J.-M. Liu, and Z. G. Liu, Appl. Phys. Lett. 84, 1731 (2004). 10.1063/1.1667612
- (2004) Appl. Phys. Lett. , vol.84 , pp. 1731
- Wang, Y.P.¹ Zhou, L.² Zhang, M.F.³ Chen, X.Y.⁴ Liu, J.-M.⁵ Liu, Z.G.⁶

24
- 34548698689
- Reduced leakage current in la and Ni codoped BiFe O3 thin films
- DOI 10.1063/1.2784968
- S. K. Singh, K. Maruyama, and H. Ishiwara, Appl. Phys. Lett. 91, 112913 (2007). 10.1063/1.2784968 (Pubitemid 47416016)
- (2007) Applied Physics Letters , vol.91 , Issue.11 , pp. 112913
- Singh, S.K.¹ Maruyama, K.² Ishiwara, H.³

25
- 67349117817
- 10.1038/nmat2432
- C.-H. Yang, J. Seidel, S. Y. Kim, P. B. Rossen, P. Yu, M. Gajek, Y. H. Chu, L. W. Martin, M. B. Holcomb, Q. He, P. Maksymovych, N. Balke, S. V. Kalinin, A. P. Baddorf, S. R. Basu, M. L. Scullin, and R. Ramesh, Nature Mater. 8, 485 (2009). 10.1038/nmat2432
- (2009) Nature Mater. , vol.8 , pp. 485
- Yang, C.-H.¹ Seidel, J.² Kim, S.Y.³ Rossen, P.B.⁴ Yu, P.⁵ Gajek, M.⁶ Chu, Y.H.⁷ Martin, L.W.⁸ Holcomb, M.B.⁹ He, Q.¹⁰ Maksymovych, P.¹¹ Balke, N.¹² Kalinin, S.V.¹³ Baddorf, A.P.¹⁴ Basu, S.R.¹⁵ Scullin, M.L.¹⁶ Ramesh, R.¹⁷

26
- 80053290063
- 10.1002/adfm.201100191
- K. Kambiz, I. Sterianou, S. Karimi, D. C. Sinclair, and I. M. Reaney, Adv. Funct. Mater. 21 (19), 3737-3743 (2011). 10.1002/adfm.201100191
- (2011) Adv. Funct. Mater. , vol.21 , Issue.19 , pp. 3737-3743
- Kambiz, K.¹ Sterianou, I.² Karimi, S.³ Sinclair, D.C.⁴ Reaney, I.M.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.