Direct imaging of lithium ions using aberration-corrected annular-bright-field scanning transmission electron microscopy and Associated contrast Mechanisms

Materials Express

Volumn 1, Issue 1, 2011, Pages 43-50

  He, Xiaoqing ^a   Gu, Lin ^a,b   Zhu, Changbao ^c   Yu, Yan ^c   Li, Chilin ^c   Hu, Yong Sheng ^a   Li, Hong ^a   Tsukimoto, Susumu ^b   Maier, Joachim ^c   Ikuhara, Yuichi ^b,d,e   Duan, Xiaofeng ^a  

^a INSTITUTE OF PHYSICS   (China)

^b TOHOKU UNIVERSITY   (Japan)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^d Japan Fine Ceramics Centre   (Japan)

^e UNIVERSITY OF TOKYO   (Japan)

Author keywords

Aberration correction; Annular bright field (ABF); Lithium ion battery; Scanning transmission electron microscopy (STEM)

Indexed keywords

EID: 84859346170     PISSN: 21585849     EISSN: 21585857     Source Type: Journal    
DOI: 10.1166/mex.2011.1006     Document Type: Article

References (38)

1. A. K. Padhi, K. S. Nanjundaswamy, and J. B. Goodenough, J. Electrochem. Soc. 144, 1188 (1997).
2. J. Maier, Nat. Mater. 4, 805 (2005).
3. A. S. Arico, P. G. Bruce, B. Scrosati, J. M. Tarascon, and W. Van Schalkwijk, Nat. Mater. 4, 366 (2005).
4. P. G. Bruce, B. Scrosati, and J. M. Tarascon, Angew. Chem. Int. Ed. 47, 2930 (2008).
5. Y. G. Guo, J. S. Hu, and L. J. Wan, Adv. Mater. 20, 4384 (2008).
6. Y. S. Hu, Y. G. Guo, R. Dominko, M. Gaberscek, J. Jamnik, and J. Maier, Adv. Mater. 19, 1963 (2007).
7. P. P. Prosini, M. Carewska, S. Scaccia, P. Wisniewski, and M. Pasquali, Electrochim. Acta 48, 4205 (2003).
8. Y. G. Wang, Y. R. Wang, E. Hosono, K. X. Wang, and H. S. Zhou, Angew. Chem. Int. Ed. 47, 7461 (2008).
9. Y. Q. Wang, J. L. Wang, J. Yang, and Y. N. Nuli, Adv. Funct. Mater. 16, 2135 (2008).
10. C. Delmas, M. Maccario, L. Croguennec, F. Le Cras, and F. Weill, Nat. Mater. 7, 665 (2008).
11. L. Laffont, C. Delacourt, P. Gibot, M. Y. Wu, P. Kooyman, C. Masquelier, and J. M. Tarascon, Chem. Mater. 18, 5520 (2006).
12. G. Y. Chen, X. Y. Song, and T. J. Richardson, Electrochem. Solid-State Lett. 9, A295 (2006).
13. A. Yamada, H. Koizumi, N. Sonoyama, and R. Kanno, Electrochem. Solid-State Lett. 8, A409 (2005).
14. W. Sigle, R. Amin, K. Weichert, P. A. van Aken, and J. Maier, Electrochem. Solid-State Lett. 12, A151 (2009).
15. O. Scherzer, Optik 2, 114 (1947).
16. M. Haider, S. Uhlemann, E. Schwan, B. Kabius, and K. Urban, Nature 392, 768 (1998).
17. P. E. Batson, N. Dellby, and O. L. Krivanek, Nature 418, 617 (2002).
18. Y. Shao-Horn, L. Croguennec, C. Delmas, E. C. Nelson, and M. A. O'Keefe, Nat. Mater. 2, 464 (2003).
19. S. D. Findlay, N. Shibata, H. Sawada, E. Okunishi, Y. Kondo, T. Yamamoto, and Y. Ikuhara, Appl. Phys. Lett. 95, 191913 (2009).
20. S. D. Findlay, N. Shibata, H. Sawada, E. Okunishi, Y. Kondo, and Y. Ikuhara, Ultramicroscopy 110, 903 (2010).
21. R. Huang, Y. H. Ikuhara, H. Moriwake, A. Kuwabara, C. A. J. Fisher, Y. Ikuhara, T. Mizoguchi, and H. Oki, Proceedings of the 22nd Fall Meeting of the Ceramic Society of Japan, ISBN 978-4-931298-56-9 (2009), p. 300.
22. R. Huang, Y. H. Ikuhara, T. Mizoguchi, S. D. Findlay, A. Kuwabara, C. A. J. Fisher, H. Moriwake, H. Oki, T. Hirayama, and Y. Ikuhara, Angew. Chem. Int. Ed. 50, 3053 (2011).
23. Y. Oshima, H. Sawada, F. Hosokawa, E. Okunishi, T. Kaneyama, Y. Kondo, S. Niitaka, H. Takagi, Y. Tanishiro, and K. Takayanagi, J. Electron Microsc. 59, 457 (2010).
24. J. M. Cowley, Appl. Phys. Lett. 15, 58 (1969).
25. H. Rose, Optik 39, 416 (1974).
26. H. Rose, Ultramicroscopy 2, 251 (1977).
27. K. Ishizuka, Ultramicroscopy 90, 71 (2001).
28. Y. Peng, P. D. Nellist, and S. J. Pennycook, J. Electron Microsc. 53, 257 (2004).
29. S. Van Aert, A. J. den Dekker, D. Van Dyck, and A. van den Bos, Ultramicroscopy 90, 273 (2002).
30. P. D. Nellist, E. C. Cosgriff, P. B. Hirsch, and D. J. H. Cockayne, Philos. Mag. 88, 135 (2008).
31. L. Gu, W. Sigle, C. T. Koch, J. Nelayah, V. Srot, and P. A. van Aken, Ultramicroscopy 109, 1164 (2009).
32. R. F. Egerton, P. Li, and M. Malac, Micron 35, 399 (2004).
33. R. F. Egerton, Ultramicroscopy 107, 575 (2007).
34. M. G. Walls and A. Howie, Ultramicroscopy 28, 40 (1989).
35. L. Gu, V. Srot, W. Sigle, C. Koch, P. van Aken, F. Scholz, S. B. Thapa, C. Kirchner, M. Jetter, and M. Rühle, Phys. Rev. B 75, 195214 (2007).
36. K. Siangchaew and M. Libera, Phil. Mag. A 80, 1001 (2000).
37. K. Varlot, J. M. Martina, C. Quet, and Y. Kihn, Ultramicroscopy 68, 123 (1997).
38. L. Gu, C. Zhu, H. Li, Y. Yu, C. Li, S. Tsukimoto, J. Maier, and Y. Ikuhara, J. Am. Chem. Soc., in press, dx.doi.org/10.1021/ja109412x.