Selection rules for Bloch wave scattering for HREM imaging of imperfect crystals along symmetry axes

Philosophical Magazine

Volumn 88, Issue 2, 2008, Pages 135-143

  Nellist, P D ^a   Cosgriff, E C ^a   Hirsch, P B ^a   Cockayne, D J H ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; SCATTERING; WAVE EFFECTS;

ATOMIC DISPLACEMENTS; BLOCH WAVE SCATTERING;

CRYSTAL STRUCTURE;

EID: 38349160699     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701765828     Document Type: Article

References (6)

1. See, for example, E. J. Kirkland, Advanced Computing in Electron Microscopy (Plenum, New York, 1998).
2. B.G. Mendis, Y. Mishin, C.S. Hartley, et al., Phil. Mag. 86 4607 (2006);
3. V. Vitek and B.G. Mendis (2007), private communication.
4. J.D. Eshelby and A.N. Stroh, Phil. Mag. 42 1401 (1951).
5. X. Xu, S. P. Beckman, P. Specht, et al., Phys. Rev. Lett. 95 145501 (2005).
6. P.B. Hirsch, A. Howie, R.B. Nicholson, et al., Electron Microscopy of Thin Crystals (Butterworths, London, 1967).