Refractive index changes in amorphous SiO 2 (silica) by swift ion irradiation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 277, Issue , 2012, Pages 126-130

  Pena Rodriguez O ^a,b   Manzano Santamaria J ^a,c   Olivares, J ^a,b   Rivera, A ^d   Agullo Lopez F ^a  

^a CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^b INSTITUTO DE ÓPTICA   (Spain)

^c CIEMAT   (Spain)

^d INSTITUTO DE FUSIÓN NUCLEAR   (Spain)

Author keywords

Ion damage; Ion irradiation; Silica; Spectroscopic ellipsometry; Swift heavy ions

Indexed keywords

AXIAL REGIONS; CYLINDRICAL TRACKS; EFFECTIVE INDEX; ELECTRONIC STOPPING POWER; FLUENCES; HOMOGENEOUS MEDIUM; ION BEAM IRRADIATION; ION DAMAGE; ION IMPACT; IRRADIATED STRUCTURES; NANO-STRUCTURED; OPTICAL MODES; OPTICAL RESPONSE; REFRACTIVE INDEX CHANGES; SMALL ANGLE X-RAY SCATTERING; STOPPING POWER; SWIFT HEAVY IONS; THEORETICAL MODELS; VIRGIN MATERIALS;

INFRARED SPECTROSCOPY; ION BOMBARDMENT; REFRACTIVE INDEX; SILICON COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY;

SILICA;

EID: 84858333426     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2011.12.057     Document Type: Article

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