Fine structure in swift heavy ion tracks in amorphous SiO2

Physical Review Letters

Volumn 101, Issue 17, 2008, Pages

  Kluth, P ^a   Schnohr, C S ^a   Pakarinen, O H ^b   Djurabekova, F ^b   Sprouster, D J ^a   Giulian, R ^a   Ridgway, M C ^a   Byrne, A P ^a   Trautmann, C ^c   Cookson, D J ^d   Nordlund, K ^b   Toulemonde, M ^e  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b UNIVERSITY OF HELSINKI   (Finland)

^c Materials Research Department   (Germany)

^d AUSTRALIAN SYNCHROTRON   (Australia)

^e Direction de la Recherche Fondamentale   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMICS; MOLECULAR DYNAMICS; NANOELECTRONICS; QUANTUM CHEMISTRY; XENON;

AMORPHOUS SIO2; FINE STRUCTURES; HIGH DENSITIES; HIGH ENERGIES; ION TRACKS; MOLECULAR DYNAMICS SIMULATIONS; PRESSURE WAVES; SMALL ANGLE X-RAY SCATTERINGS; SWIFT HEAVY ION TRACKS; UNIRRADIATED MATERIALS;

IONS;

EID: 55149105268     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.101.175503     Document Type: Article

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