Electronic damage in quartz (c-SiO 2) by MeV ion irradiations: Potentiality for optical waveguiding applications

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 272, Issue , 2012, Pages 271-274

  Manzano Santamaria J ^a,c   Olivares, J ^a,b   Rivera, A ^d   Agullo Lopez F ^a  

^a CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

^b INSTITUTO DE ÓPTICA   (Spain)

^c CIEMAT   (Spain)

^d UNIVERSIDAD POLITÉCNICA DE MADRID   (Spain)

Author keywords

Electronic damage; Optical waveguides; Quartz; Swift ions

Indexed keywords

AMORPHOUS LAYER; ELECTRONIC DAMAGE; ELECTRONIC MECHANISMS; ELECTRONIC STOPPING; FLUENCES; ISOTROPIC REFRACTIVE INDEX; KINETIC REGIME; MEV ENERGY; MEV ION IRRADIATION; OPTICAL METHODS; OPTICAL WAVEGUIDING APPLICATIONS; POISSON CURVE; SAMPLE SURFACE; STOPPING POWER; SWIFT IONS; TRACK CORES;

OPTICAL WAVEGUIDES; REFRACTIVE INDEX; SILICON COMPOUNDS; WAVEGUIDES;

QUARTZ;

EID: 84655176537     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2011.01.081     Document Type: Conference Paper

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