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Volumn 266, Issue 12-13, 2008, Pages 2994-2997

Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

Author keywords

Latent tracks; SAXS; SiO2; Swift heavy ion irradiation

Indexed keywords

AMORPHOUS MATERIALS; HEAVY IONS; INELASTIC NEUTRON SCATTERING; ION BOMBARDMENT; THERMAL EFFECTS; X RAY SCATTERING;

EID: 44649141893     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.182     Document Type: Article
Times cited : (42)

References (26)
  • 21
    • 44649086482 scopus 로고    scopus 로고
    • P. Kluth et al., in preparation.
    • P. Kluth et al., in preparation.
  • 23
    • 44649190472 scopus 로고    scopus 로고
    • R. Giulian, P. Kluth, B. Johannessen, D.J. Cookson, M.C. Ridgway, in: Proceedings of the Fifth International Conference on Synchrotron Radiation in Materials Science, SRMS 5, No. 155, 2006.
    • R. Giulian, P. Kluth, B. Johannessen, D.J. Cookson, M.C. Ridgway, in: Proceedings of the Fifth International Conference on Synchrotron Radiation in Materials Science, SRMS 5, No. 155, 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.