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Volumn 13, Issue 5, 2012, Pages 875-884

Fixed negative interface charges compromise organic ferroelectric field-effect transistors

Author keywords

Ferroelectric polarization; Ferroelectric polymer; Memory device; Organic FeFET; Organic TFT; Trapped charges

Indexed keywords

COERCIVE FORCE; DATA STORAGE EQUIPMENT; FERROELECTRICITY; ORGANIC FIELD EFFECT TRANSISTORS; POLARIZATION; THRESHOLD VOLTAGE; TRANSISTORS;

EID: 84857663714     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2012.01.034     Document Type: Article
Times cited : (12)

References (54)
  • 23
    • 79952146219 scopus 로고    scopus 로고
    • P. Heremans, G. Gelinck, R. Müller, K.-J. Baeg, D.-Y. Kim, Y.-Y. Noh, Chem. Mat. 23 (2011) p. 341.
    • (2011) Chem. Mat. , vol.23 , pp. 341
    • P. Heremans1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.