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Volumn 98, Issue 3, 2011, Pages

Stability of polarization in organic ferroelectric metal-insulator- semiconductor structures

Author keywords

[No Author keywords available]

Indexed keywords

DEPLETION VOLTAGE; DIELECTRIC MEASUREMENTS; FERROELECTRIC POLYMERS; FLAT-BAND VOLTAGE; GATE INSULATOR; METAL INSULATOR SEMICONDUCTOR STRUCTURES; NEGATIVE CHARGE; NEGATIVE SHIFT; ORGANIC METALS; POLARIZATION STATE; SEMICONDUCTOR-INSULATOR INTERFACE; TRIFLUOROETHYLENE;

EID: 79251542980     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3543632     Document Type: Article
Times cited : (22)

References (27)
  • 11
    • 0032511040 scopus 로고    scopus 로고
    • 0036-8075, 10.1126/science.280.5370.1741
    • H. Sirringhaus, N. Tesslera, and R. H. Friend, Science 0036-8075 280, 1741 (1998). 10.1126/science.280.5370.1741
    • (1998) Science , vol.280 , pp. 1741
    • Sirringhaus, H.1    Tesslera, N.2    Friend, R.H.3
  • 18
    • 0020847524 scopus 로고
    • 0015-0193.
    • F. Bauer, Ferroelectrics 0015-0193 49, 231 (1983).
    • (1983) Ferroelectrics , vol.49 , pp. 231
    • Bauer, F.1
  • 23
  • 27
    • 40849088204 scopus 로고    scopus 로고
    • 0003-6951, 10.1063/1.2897238
    • N. Alves and D. M. Taylor, Appl. Phys. Lett. 0003-6951 92, 103312 (2008). 10.1063/1.2897238
    • (2008) Appl. Phys. Lett. , vol.92 , pp. 103312
    • Alves, N.1    Taylor, D.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.