Thin-film field-effect transistors: The effects of traps on the bias and temperature dependence of field-effect mobility, including the Meyer-Neldel rule

Organic Electronics

Volumn 7, Issue 6, 2006, Pages 592-599

  Stallinga, P ^a   Gomes, H L ^a  

^a UNIVERSITY OF ALGARVE   (Portugal)

Author keywords

Meyer Neldel rule; Temperature dependence; Thin film transistors; Traps

Indexed keywords

ELECTRIC CURRENT CARRYING CAPACITY (CABLES); ELECTRON MOBILITY; ELECTRON TRAPS; THERMAL EFFECTS;

FIELD EFFECT MOBILITY; MEYER-NELDEL RULE; TEMPERATURE DEPENDENCE; TRAPS;

THIN FILM TRANSISTORS;

EID: 33751018886     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2006.10.003     Document Type: Article

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