Separating interface state response from parasitic effects in conductance measurements on organic metal-insulator-semiconductor capacitors

Journal of Applied Physics

Volumn 103, Issue 5, 2008, Pages

  Taylor, D M ^a   Alves, N ^a,b  

^a BANGOR UNIVERSITY   (United Kingdom)

^b SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; ELECTRIC CONDUCTANCE; OHMIC CONTACTS; SEMICONDUCTOR INSULATOR BOUNDARIES;

METAL-INSULATOR- SEMICONDUCTOR (MIS); PARASITIC TRANSISTORS;

SEMICONDUCTOR MATERIALS;

EID: 40849092806     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2844435     Document Type: Article

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