Profile monitoring with binary data and random predictors

Journal of Quality Technology

Volumn 43, Issue 3, 2011, Pages 196-208

  Shang, Yanfen ^a   Tsung, Fugee ^a   Zou, Changliang ^b  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^b NANKAI UNIVERSITY   (China)

Author keywords

Categorical response; Exponential weighted moving average; Generalized linear model; Profile monitoring; Random explanatory variables; Statistical process control

Indexed keywords

PROCESS CONTROL; REGRESSION ANALYSIS;

CATEGORICAL RESPONSE; EXPLANATORY VARIABLES; EXPONENTIAL WEIGHTED MOVING AVERAGE; GENERALIZED LINEAR MODEL; PROFILE MONITORING;

STATISTICAL PROCESS CONTROL;

EID: 84857601526     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2011.11917857     Document Type: Article

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