Monitoring general linear profiles using multivariate exponentially weighted moving average schemes

Technometrics

Volumn 49, Issue 4, 2007, Pages 395-408

  Zou, Changliang ^a   Tsung, Fugee ^b   Wang, Zhaojun ^a  

^a NANKAI UNIVERSITY   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Change point detection; Linear profiles; Statistical process control

Indexed keywords

INDUSTRIAL APPLICATIONS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; POLYNOMIALS; QUALITY CONTROL;

CHANGE POINT DETECTION; LINEAR PROFILES; SEMICONDUCTOR MANUFACTURING;

STATISTICAL PROCESS CONTROL;

EID: 36849064218     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1198/004017007000000164     Document Type: Article

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