Statistical monitoring of nonlinear product and process quality profiles

Quality and Reliability Engineering International

Volumn 23, Issue 8, 2007, Pages 925-941

  Williams, James D ^a   Woodall, William H ^b   Birch, Jeffrey B ^b  

^a GE GLOBAL RESEARCH   (United States)

^b VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

Functional data; Minimum volume ellipsoid; Multivariate statistical process control; Nonlinear regression; T2 chart; Vertical density profile

Indexed keywords

DATA REDUCTION; LINEAR REGRESSION; MATHEMATICAL MODELS; PROCESS CONTROL; STATISTICS;

PARAMETRIC NONLINEAR REGRESSION MODELS; PROCESS QUALITY; STATISTICAL MONITORING;

NONLINEAR ANALYSIS;

EID: 37249043822     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.858     Document Type: Article

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