Detecting outliers in complex profiles using a χ2 control chart method

IIE Transactions (Institute of Industrial Engineers)

Volumn 41, Issue 4, 2009, Pages 335-345

  Zhang, Hang ^a   Albin, Susan ^b  

^a Arizona State University   (United States)

^b DEPARTMENT OF INDUSTRIAL AND SYSTEMS ENGINEERING   (United States)

Author keywords

2 control chart; Data mining; Outlier detection; Profile; Statistical process control

Indexed keywords

FLOWCHARTING; FUNCTIONS; INDUSTRIAL APPLICATIONS; INFORMATION MANAGEMENT; PROBABILITY DENSITY FUNCTION; PROCESS ENGINEERING; QUALITY CONTROL; REGRESSION ANALYSIS; STATISTICAL PROCESS CONTROL; SURFACE TREATMENT; VECTORS;

BASELINE DATUM; COMPLEX PROFILES; DATA MINING; DIMENSION VECTORS; EXPLANATORY VARIABLES; EXPLICIT EXPRESSIONS; MANUFACTURING PROCESS; NON-LINEAR REGRESSION METHODS; ON-LINE MONITORING; OUTLIER DETECTION; PROFILE; QUALITY OF PRODUCTS; REGRESSION MODELS; SIMULATION EXPERIMENTS;

PROCESS CONTROL;

EID: 59749103317     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/07408170802323000     Document Type: Article

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