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Volumn 40, Issue 1, 2008, Pages 1-18

Statistical process control for geometric specifications: On the monitoring of roundness profiles

Author keywords

Control charts; Geometric tolerance; Multivariate control chart; Profile monitoring; Regression; Spatial statistics; SPC

Indexed keywords

COMPUTATIONAL GEOMETRY; ERROR STATISTICS; MATHEMATICAL MODELS; REGRESSION ANALYSIS; SPECIFICATIONS;

EID: 39449124359     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2008.11917709     Document Type: Article
Times cited : (106)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.