Microstructural, optical and electrical studies on sol gel derived ZnO and ZnO:Al films

Current Applied Physics

Volumn 12, Issue 3, 2012, Pages 963-968

  Caglar, Yasemin ^a   Caglar, Müjdat ^a   Ilican, Saliha ^a  

^a ANADOLU UNIVERSITY   (Turkey)

Author keywords

Electrical conductivity; Microstructure; Sol gel; ZnO film

Indexed keywords

ABSORPTION EDGES; AL-DOPING; ATOMIC FORCE MICROSCOPES; CONDUCTIVITY MEASUREMENTS; CRYSTALLINE STRUCTURE; ELECTRICAL CONDUCTIVITY; ELECTRICAL STUDIES; FIELD EMISSION SCANNING ELECTRON MICROSCOPES; GLASS SUBSTRATES; LOWER ENERGIES; MICRO-STRUCTURAL; SHRINKAGE EFFECTS; SOL-GEL METHODS; TEMPERATURE DEPENDENCE; URBACH ENERGY; VISIBLE REGION; ZNO; ZNO FILM; ZNO FILMS; ZNO:AL FILMS;

ACTIVATION ENERGY; ALUMINUM; ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; GELS; METALLIC FILMS; MICROSTRUCTURE; SOL-GELS; SOLS; SUBSTRATES; X RAY DIFFRACTION; ZINC OXIDE;

SEMICONDUCTOR DOPING;

EID: 84857446226     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2011.12.017     Document Type: Article

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