On impedance spectroscopy analysis of nonideal heterojunctions

Semiconductor Science and Technology

Volumn 27, Issue 3, 2012, Pages

  Brus, V V ^a  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE INTERFACE; BARRIER CAPACITANCE; ENERGY DISTRIBUTIONS; IMPEDANCE SPECTROSCOPY; NONIDEAL; PARASITIC INDUCTANCES; SERIES RESISTANCES; SHUNT RESISTANCES; SURFACE STATE DENSITY;

ELECTRIC RESISTANCE; HETEROJUNCTION BIPOLAR TRANSISTORS;

HETEROJUNCTIONS;

EID: 84857422753     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/27/3/035024     Document Type: Article

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