Simulation for capacitance correction from Nyquist plot of complex impedance-voltage characteristics

Solid-State Electronics

Volumn 52, Issue 6, 2008, Pages 990-996

  Kavasoglu, A Sertap ^a   Kavasoglu, Nese ^a   Oktik, Sener ^a  

^a MUGLA SITKI KOCMAN UNIVERSITY   (Turkey)

Author keywords

Built in potential; Capacitance correction; Complex impedance; Device simulation; Nyquist plot; Series resistance subtraction

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTER SIMULATION; ELECTRIC RESISTANCE; ERROR ANALYSIS; VOLTAGE MEASUREMENT;

CAPACITANCE CORRECTION; COMPLEX IMPEDANCE; DEVICE SIMULATION; NYQUIST PLOT; SERIES RESISTANCE SUBTRACTION;

SEMICONDUCTOR DEVICES;

EID: 42749090968     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2008.02.004     Document Type: Article

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