Development of scattering near-field optical microspectroscopy apparatus using an infrared synchrotron radiation source

Optics Communications

Volumn 285, Issue 8, 2012, Pages 2212-2217

  Ikemoto, Yuka ^a   Ishikawa, Michio ^b   Nakashima, Satoru ^b   Okamura, Hidekazu ^c   Haruyama, Yuichi ^d   Matsui, Shinji ^d   Moriwaki, Taro ^a   Kinoshita, Toyohiko ^a  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c KOBE UNIVERSITY   (Japan)

^d UNIVERSITY OF HYOGO   (Japan)

Author keywords

Infrared spectroscopy; Infrared synchrotron radiation; Near field microscopy

Indexed keywords

BROAD BANDS; DIFFRACTION LIMITS; FOURIER TRANSFORM INFRARED SPECTROMETER; HARMONIC COMPONENTS; HIGH SPATIAL RESOLUTION; HIGHER HARMONICS; IR SOURCE; LOCK-IN DETECTION; MICRO SPECTROSCOPY; NEAR-FIELD; NEAR-FIELD MICROSCOPY; NEAR-FIELD SPECTROSCOPY; OPTICAL MICROSPECTROSCOPY; SAMPLE SURFACE; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SPATIAL RESOLUTION; SPRING-8; SYNCHROTRON RADIATION SOURCE;

FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED SPECTROSCOPY; NEAR FIELD SCANNING OPTICAL MICROSCOPY; SYNCHROTRON RADIATION;

SCATTERING;

EID: 84857062553     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2011.12.106     Document Type: Article

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