|
Volumn 9, Issue , 2011, Pages 40-45
|
Application of a modulating technique to detect near-field signals using a conventional IR spectrometer with a ceramic light source
b
Hachioji shi
(Japan)
d
KOBE UNIVERSITY
(Japan)
|
Author keywords
And manipulation technology; Atomic force microscopy; Infrared absorption spectroscopy; Lithography; Measurement; Nano scale imaging
|
Indexed keywords
ABSORPTION SPECTROSCOPY;
ATOMIC FORCE MICROSCOPY;
CERAMIC MATERIALS;
ELECTRON BEAM LITHOGRAPHY;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
IMAGE RESOLUTION;
INFRARED ABSORPTION;
INFRARED SPECTROMETERS;
LIGHT ABSORPTION;
LIGHT AMPLIFIERS;
LIGHT SOURCES;
LITHOGRAPHY;
MEASUREMENT;
MODULATION;
NANOTECHNOLOGY;
OPTICAL MICROSCOPY;
PROBES;
SIGNAL DETECTION;
MANIPULATION TECHNOLOGIES;
MODULATING TECHNIQUES;
MODULATION SYSTEMS;
NANO-SCALE IMAGING;
NEAR FIELD OPTICAL MICROSCOPY;
NEAR FIELD SIGNALS;
SECOND HARMONIC COMPONENT;
TOPOGRAPHIC IMAGES;
SPECTROMETERS;
|
EID: 79952404682
PISSN: None
EISSN: 13480391
Source Type: Journal
DOI: 10.1380/ejssnt.2011.40 Document Type: Article |
Times cited : (4)
|
References (11)
|