In situ transmission electron microscopy analysis of electron beam induced crystallization of amorphous marks in phase-change materials

Journal of Applied Physics

Volumn 96, Issue 6, 2004, Pages 3193-3198

  Kaiser, M ^a   Van Pieterson, L ^a   Verheijen, M A ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; COMPACT DISKS; CRYSTAL STRUCTURE; CRYSTALLIZATION; DATA REDUCTION; DOPING (ADDITIVES); ELECTRON BEAMS; HEATING; IRRADIATION; MORPHOLOGY; OPTICAL RECORDING; QUENCHING; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

DATA MARKS; DIGITAL VERSATILE DISK (DVD); PHASE-CHANGE MATERIALS; SUPERSTRUCTURES;

GALLIUM COMPOUNDS;

EID: 4944222322     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1775297     Document Type: Article

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