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Volumn 114, Issue 32, 2010, Pages 13890-13894

Structure and disorder in amorphous alumina thin films: Insights from high-resolution solid-state NMR

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS ALUMINA; AMORPHOUS OXIDES; AMORPHOUS STATE; AMORPHOUS THIN FILMS; ATOMIC LAYER; CATALYTIC ABILITY; DEPOSITION METHODS; FIVE-COORDINATED; GLASS SCIENCE; HIGH RESOLUTION; PROCESSING CONDITION; SOLID STATE NMR; TWO-STATE; VAPOR-DEPOSITED FILMS;

EID: 77956145713     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp105306r     Document Type: Article
Times cited : (97)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.