Correlations between well potential and SEUs measured by well-potential perturbation detectors in 65nm

2011 Proceedings of Technical Papers: IEEE Asian Solid-State Circuits Conference 2011, A-SSCC 2011

Volumn , Issue , 2011, Pages 209-212

  Furuta, Jun ^a   Yamamoto, Ryosuke ^c   Kobayashi, Kazutoshi ^c   Onodera, Hidetoshi ^a,b  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c KYOTO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR ACTION; BULK CMOS; CELL-BASED; MEASUREMENT RESULTS; NEIGHBOURHOOD; VOLTAGE LEVELS;

NEUTRON IRRADIATION;

SHIFT REGISTERS;

EID: 84856363689     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASSCC.2011.6123639     Document Type: Conference Paper

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