Evaluating fault coverage of bulk built-in current sensor for soft errors in combinational and sequential logic

SBCCI 2005 - 18th Symposium on Integrated Circuits and Systems Design

Volumn , Issue , 2005, Pages 62-67

  Neto, Egas Henes ^a   Ribeiro, Ivandro ^a   Vieira, Michele ^a   Wirth, Gilson ^a   Kastensmidt, Fernanda Lima ^b  

^a UNIVERSIDADE ESTADUAL DO RIO GRANDE DO SUL   (Brazil)

^b FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

BICS; SET; SEU; Soft error detection

Indexed keywords

CHARGED PARTICLES; DETECTORS; ERROR CORRECTION; FUZZY LOGIC; INTEGRATED CIRCUITS; LOGIC CIRCUITS; NETWORKS (CIRCUITS); SENSORS; SYSTEMS ANALYSIS;

BUILT-IN CURRENT SENSOR (BICS); CMOS TECHNOLOGIES; COMBINATIONAL CIRCUITS; CORRUPTED REGION; CURRENT PULSING; DETECTION SENSITIVITY; FAULT COVERAGE (FC); NEW APPROACHES; NMOS TRANSISTORS; POWER CONSUMPTION (CE); SEQUENTIAL LOGICS; SOFT ERRORS (SE); SPICE SIMULATIONS; SYSTEMS DESIGN;

SPICE;

EID: 46449085015     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SBCCI.2005.4286833     Document Type: Conference Paper

References (8)

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