On the measure of dislocation densities from diffraction line profiles: A comparison with discrete dislocation methods

Acta Materialia

Volumn 60, Issue 4, 2012, Pages 1467-1477

  Balogh, L ^a   Capolungo, L ^b   Tome C N ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Dislocations; Line profile analysis; X ray

Indexed keywords

ACCURATE PREDICTION; ANALYTICAL MODEL; DIFFRACTION LINES; DIFFRACTION PEAKS; DISCRETE DISLOCATION DYNAMICS; DISCRETE DISLOCATION METHOD; DISLOCATION DENSITIES; DISLOCATION MICROSTRUCTURES; ELASTIC STRAIN; FACE-CENTERED CUBIC; LINE PROFILE ANALYSIS; LONG RANGE ORDERS; PEAK BROADENING; SIMULATED MICROSTRUCTURES; THREE-DIMENSIONAL MICROSTRUCTURES;

ANALYTICAL MODELS; DIFFRACTION; DISLOCATIONS (CRYSTALS); MICROSTRUCTURE; MODELS;

COMPUTER SIMULATION;

EID: 84856078209     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.10.037     Document Type: Article

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