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Volumn 528, Issue 1, 2010, Pages 112-121

Characterization of the microstructure in random and textured polycrystals and single crystals by diffraction line profile analysis

(2) Ribárik, Gábor a Ungár, Tamás a

a EÖTVÖS LORÁND UNIVERSITY (Hungary)

Author keywords

Dislocation structure; Planar defects; Strain anisotropy; Texture; X ray line broadening

Indexed keywords

ANISOTROPY; CONTINUUM MECHANICS; CONVOLUTION; CRYSTAL SYMMETRY; CRYSTALLOGRAPHY; DEFECT DENSITY; DIFFRACTION PATTERNS; DISLOCATIONS (CRYSTALS); INTERFEROMETRY; NEUTRON DIFFRACTION; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; SOFTWARE PACKAGES; STACKING FAULTS; TEXTURES;

DIFFRACTION LINES; DISLOCATION STRUCTURES; LINE PROFILE ANALYSIS; PLANAR DEFECT; PROFILE FUNCTIONS; RANDOM POLYCRYSTALS; STRAIN ANISOTROPIES; TEXTURED POLYCRYSTALS; X RAY DIFFRACTION PATTERNS; X-RAY LINE BROADENING;

DISTRIBUTION FUNCTIONS;

EID: 77958452875 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/j.msea.2010.08.059 Document Type: Article

Times cited : (163)

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