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Volumn 407, Issue 4, 2012, Pages 670-673
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Investigation of micropipes in 6HSiC by Raman scattering
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Author keywords
Micropipe; Raman scattering; SiC
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Indexed keywords
FIRST-ORDER;
INCIDENT LASER;
INNER WALLS;
MICROPIPES;
RAMAN FEATURE;
SECOND ORDER SCATTERING;
SECOND ORDERS;
SELECTION RULES;
SIC;
STRUCTURAL DEFECT;
THREADING EDGE DISLOCATION;
TRANSVERSE OPTICAL PHONONS;
UNEVEN SURFACES;
WURTZITE STRUCTURE;
FEATURE EXTRACTION;
RAMAN SCATTERING;
SCATTERING;
SCREW DISLOCATIONS;
SILICON CARBIDE;
ZINC SULFIDE;
EDGE DISLOCATIONS;
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EID: 84855865223
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2011.12.001 Document Type: Article |
Times cited : (11)
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References (16)
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