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Volumn 338, Issue , 2000, Pages
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Carrier density evaluation in p-type SiC by Raman scattering
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
CARRIER CONCENTRATION;
CHARGE CARRIERS;
ELECTRON TRANSITIONS;
PHONONS;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
FANO INTERFERENCE;
SILICON CARBIDE;
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EID: 12944283268
PISSN: 02555476
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (18)
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References (5)
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