Simulation of vibrational resonances of stiff AFM cantilevers by finite element methods

New Journal of Physics

Volumn 11, Issue , 2009, Pages

  Espinoza Beltran F J ^a   Geng, K ^b   Munoz Saldana J ^a   Rabe, U ^b   Hirsekorn, S ^b   Arnold, W ^b,c  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

^b FRAUNHOFER INSTITUTE FOR NONDESTRUCTIVE TESTING IZFP   (Germany)

^c SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AFM CANTILEVERS; ATOMIC FORCE MICROSCOPE CANTILEVERS; CONTACT MECHANICS; CONTACT STIFFNESS; CUBIC SYMMETRY; FEM MODELS; FITTING PROCEDURE; FREE END; GEOMETRICAL DIMENSIONS; GEOMETRICAL SHAPES; IN-PLANE; ITERATIVE PROCEDURES; OUT-OF-PLANE; RESONANT FREQUENCIES; SILICON SINGLE CRYSTALS; SPRING CONSTANTS; TIP-SAMPLE CONTACT; TRAPEZOIDAL CROSS SECTIONS; VIBRATIONAL RESONANCE;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; CANTILEVER BEAMS; CRYSTAL SYMMETRY; NANOCANTILEVERS; NATURAL FREQUENCIES; SIMULATORS; SINGLE CRYSTALS; STIFFNESS;

FINITE ELEMENT METHOD;

EID: 70349422290     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/8/083034     Document Type: Article

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