Conductive-probe AFM characterization of graphene sheets bonded to gold surfaces

Applied Surface Science

Volumn 258, Issue 7, 2012, Pages 2920-2926

  Hauquier, Fanny ^a,b   Alamarguy, David ^a   Viel, Pascal ^b   Noël, Sophie ^a   Filoramo, Arianna ^b   Huc, Vincent ^c   Houzé, Frédéric ^a   Palacin, Serge ^b  

^a UNIV PARIS SUD   (France)

^b CNRS UMR 3299   (France)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

AFM; Electrical properties; Friction; Graphene; Raman

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; ELECTRIC PROPERTIES; FRICTION; GOLD; ORGANIC COATINGS; PROBES; TRIBOLOGY;

CONDUCTING PROBE-ATOMIC FORCE MICROSCOPIES; CURRENT VOLTAGE CURVE; DISPLAY CHARACTERISTICS; ELECTRICAL RESISTANCES; LATERAL FORCE MICROSCOPY; MECHANICAL AND ELECTRICAL; METAL-MOLECULE-METAL JUNCTIONS; RAMAN;

GRAPHENE;

EID: 84855537268     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.10.152     Document Type: Article

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