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Volumn 409, Issue 2, 1998, Pages 307-319

Electron spectroscopy of single crystal and polycrystalline cerium oxide surfaces

(3) Mullins, D R a Overbury, S H a Huntley, D R a

a OAK RIDGE NATIONAL LABORATORY (United States)

Author keywords

Cerium; Cerium oxide; Electron energy loss spectroscopy (EELS); Low index single crystal surfaces; Near edge extended X ray absorption fine structure (NEXAFS); Oxidation; Photoelectron emission; Polycrystalline surfaces; Soft X ray photoelectron spectroscopy

Indexed keywords

BAND STRUCTURE; BINDING ENERGY; CERIUM COMPOUNDS; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; OXIDATION; PHOTOEMISSION; POLYCRYSTALLINE MATERIALS; RELAXATION PROCESSES; SPUTTERING; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

BAND BENDING; CERIUM OXIDE; NEAR EDGE EXTENDED X RAY ABSORPTION FINE STRUCTURE; PHOTOELECTRON EMISSION; SYNCHROTRON RADIATION PHOTOELECTRON SPECTROSCOPY; VALENCE BAND PHOTOEMISSION;

SURFACE PHENOMENA;

EID: 0032120925 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00257-X Document Type: Article

Times cited : (890)

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