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Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 24, 2009, Pages

Effect of amorphous interface layers on crystalline thin-film x-ray diffraction

(6) Weisemoeller, T a,b Bertram, F a,b Gevers, S a,b Deiter, C a,b Greuling, A a,b Wollschlager J a,b

a UNIVERSITY OF OSNABRÜCK (Germany)

b Center of Interface Science (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650113145 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.79.245422 Document Type: Article

Times cited : (11)

References (13)

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