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AIP Advances

Volumn 1, Issue 4, 2011, Pages

Dynamically controlled charge sensing of a few-electron silicon quantum dot

(4) Yang, C H a Lim, W H a Zwanenburg, F A a Dzurak, A S a

a UNIVERSITY OF NEW SOUTH WALES (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

FEEDBACK; METALS; MOS DEVICES; NANOCRYSTALS; OXIDE SEMICONDUCTORS; ROBUST CONTROL; SILICON COMPOUNDS; SINGLE ELECTRON TRANSISTORS;

CHARGE SENSING; CHARGE SENSORS; DIGITALLY CONTROLLED; DYNAMIC FEEDBACK; MEASUREMENTS OF; ROBUST DETECTION; SILICON QUANTUM DOTS; SINGLE-ELECTRON LEVELS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 84855326558 PISSN: None EISSN: 21583226 Source Type: Journal
DOI: 10.1063/1.3654496 Document Type: Article

Times cited : (70)

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