Nano-X-ray absorption spectroscopy of single Co-implanted ZnO nanowires

Nano Letters

Volumn 11, Issue 12, 2011, Pages 5322-5326

  Segura Ruiz, J ^a   Martinez Criado G ^a   Chu, M H ^a   Geburt, S ^b   Ronning, C ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

dilute magnetic semiconductors; EXAFS; nanowires; XANES; ZnO

Indexed keywords

AXIAL DIRECTION; BEAM SIZE; CO CONTENT; DILUTE MAGNETIC SEMICONDUCTORS; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURE DATUM; HARD X RAY; HOST LATTICE; INTER-ATOMIC DISTANCES; LENGTH SCALE; LOCAL STRUCTURE; STRUCTURAL DISORDERS; STRUCTURAL ORDERS; THERMAL-ANNEALING; WURTZITES; X RAY FLUORESCENCE; X-RAY ABSORPTION NEAR-EDGE STRUCTURE; XANES; ZNO; ZNO NANOWIRES; ZNO STRUCTURES;

ABSORPTION SPECTRA; EXTENDED X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; FLUORESCENCE; MAGNETIC SEMICONDUCTORS; NANOWIRES; RADIATION DAMAGE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY ABSORPTION SPECTROSCOPY; ZINC; ZINC SULFIDE;

ZINC OXIDE;

EID: 83655164357     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl202799e     Document Type: Article

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