Coherent x-ray diffraction imaging of ZnO nanostructures under confined illumination

New Journal of Physics

Volumn 13, Issue , 2011, Pages

  Xiong, Gang ^a   Huang, Xiaojing ^a,b   Leake, Steven ^a,c   Newton, Marcus C ^a   Harder, Ross ^b   Robinson, Ian K ^a,d  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b ARGONNE NATIONAL LABORATORY   (United States)

^c Swiss Light Source   (Switzerland)

^d DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BEAM PROFILES; COHERENT X-RAY DIFFRACTION; DENSITY MAPS; DIFFRACTION INTENSITY; FOCUSED BEAMS; MAXIMUM PHASE; NANOMETRES; PHASE MAPS; RADIAL DIRECTION; SCANNING ELECTRON MICROSCOPE; SPACE STRUCTURE; SURFACE FEATURE; X RAY BEAM; ZNO; ZNO NANOROD; ZNO NANOSTRUCTURES;

DIFFRACTION; NANORODS; SCANNING ELECTRON MICROSCOPY; SPACE PLATFORMS; X RAY OPTICS; X RAYS; ZINC OXIDE;

X RAY DIFFRACTION;

EID: 79953793456     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/13/3/033006     Document Type: Article

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