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Volumn 5, Issue 3, 2011, Pages 95-97
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Direct observation of elemental segregation in InGaN nanowires by X-ray nanoprobe
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Author keywords
InGaN; Nanowires; X ray fluorescence; X ray nanoprobe
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Indexed keywords
AXIAL DISTRIBUTION;
COMPOSITIONAL DISORDER;
DIRECT OBSERVATION;
ELEMENTAL DISTRIBUTION;
ELEMENTAL SEGREGATION;
INGAN;
RAMAN SCATTERING MEASUREMENTS;
SI(111) SUBSTRATE;
SINGLE NANOWIRES;
X-RAY FLUORESCENCE;
X-RAY NANOPROBE;
FLUORESCENCE;
GALLIUM;
GALLIUM COMPOUNDS;
INDIUM;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
NANOPROBES;
PHOTOLUMINESCENCE;
PHOTOLUMINESCENCE SPECTROSCOPY;
RAMAN SCATTERING;
SCATTERING;
SEMICONDUCTING SILICON COMPOUNDS;
SYNCHROTRON RADIATION;
X RAYS;
NANOWIRES;
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EID: 79952225760
PISSN: 18626254
EISSN: 18626270
Source Type: Journal
DOI: 10.1002/pssr.201004527 Document Type: Letter |
Times cited : (13)
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References (13)
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