Static TOF-SIMS. A VAMAS interlaboratory study. Part II - Accuracy of the mass scale and G-SIMS compatibility

Surface and Interface Analysis

Volumn 39, Issue 10, 2007, Pages 817-825

  Gilmore, I S ^a   Green, F M ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

Calibration; G SIMS; Interlaboratory; Mass; Static SIMS

Indexed keywords

CALIBRATION; DATA REDUCTION;

G-SIMS; INTERLABORATORY; RELATIVE INSTRUMENT SPECTRAL RESPONSE (RISR); STATIC SIMS;

SECONDARY ION MASS SPECTROMETRY;

EID: 35349011516     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2596     Document Type: Article

References (10)

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4. Gilmore IS, Seah MP. VAMAS 2002: Static ToF-SIMS Interlaboratory Study - protocol for analysis, ISSN 1475-6684.
5. Green FM, Gilmore IS, Seah MP. J. Am. Soc. Mass Spectrom. 2006; 17:514.
6. Reichlmaier S, Hammond JS, Hearn MJ, Briggs D. Surf. Interface Anal. 1995; 21: 739.
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9. Gilmore IS, Green FM, Seah MP. Appl. Surf. Sci. 2006; 252:6601.
10. NPL website, htrp://www.npl.co.uk/nanoanalysis/easygsims.html, 2006.