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Surface and Interface Analysis

Volumn 37, Issue 8, 2005, Pages 651-672

Static TOF-SIMS - A VAMAS interlaboratory study. Part I. Repeatability and reproducibility of spectra

(3) Gilmore, I S a Seah, M P a Green, F M a

a NATIONAL PHYSICAL LABORATORY (United Kingdom)

Author keywords

Calibration; Repeatability; Reproducibility; Static SIMS; TOF SIMS

Indexed keywords

CALIBRATION; CONTAMINATION; DATA REDUCTION; ELECTRIC POTENTIAL; OLIGOMERS; POLYCARBONATES; POLYSTYRENES; RESEARCH LABORATORIES;

REPEATABILITY; REPRODUCIBILITY; STATIC SECONDARY ION MASS SPECTROSCOPY (SIMS); TOF-SIMS;

SECONDARY ION MASS SPECTROMETRY;

EID: 23444455836 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.2061 Document Type: Article

Times cited : (22)

References (23)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.