Static SIMS inter-laboratory study

Surface and Interface Analysis

Volumn 29, Issue 9, 2000, Pages 624-637

  Gilmore, I S ^a   Seah, M P ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

POLYTETRAFLUOROETHYLENES; SILVER; SPECTROMETERS;

POLYETHENE TEREPHTHALATE;

SECONDARY ION MASS SPECTROMETRY;

EID: 0034276071     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200009)29:9<624::AID-SIA908>3.0.CO;2-F     Document Type: Article

References (11)

1. Seah MP, Cumpson PJ. NPL AES and XPS Intensity Calibration Software. National Physical Laboratory: Teddington, UK, 1997.
2. Briggs D, Brown A, Vickerman JC. Handbook of Static Secondary Ion Mass Spectrometry (SIMS). Wiley: Chichester, 1989.
3. Newman JG, Carlson BA, Michael RS, Moulder JF, Hohlt TA. Static SIMS Handbook of Polymer Analysis. Perkin Elmer: Eden Prairie, MN, 1991.
4. Vickerman JC, Briggs D, Henderson A. The Static SIMS Library. Surface Spectra: Manchester, 1998.
5. Schwede BC, Heller T, Rading D, Niehuis E, Wiedmann L, Benninghoven A. The Münster High Mass Resolution Static SIMS Library. ION-TOF: Münster, 1999.
6. Gilmore IS, Seah MP. Surf. Interface Anal. 1995; 23: 191.
7. Gilmore IS, Seah MP. Surf. Interface Anal. 1996; 24: 746.
8. Gilmore IS, Seah MP. NPL Report CMMT(D)165 1996.
9. Gilmore IS, Seah MP. NPL Report CMMT(D)14 1996.
10. Gilmore IS, Seah MP. Appl. Surf. Science, in press.
11. Reichlmaier S, Hammond JS, Hearn MJ, Briggs D. Surf. Interface Anal. 1995; 21: 739.