Impact of sidewall roughness on integrated Bragg gratings

Journal of Lightwave Technology

Volumn 29, Issue 24, 2011, Pages 3693-3704

  Simard, A D ^a   Ayotte, N ^a   Painchaud, Y ^b   Bedard S ^a   LaRochelle, S ^a  

^a UNIVERSITÉ LAVAL   (Canada)

^b TERAXION   (Canada)

Author keywords

Bragg grating; integrated optics; optical filter; photonic wires; sidewall roughness; silicon on insulator; weak grating approximation

Indexed keywords

APODIZED GRATINGS; COMPUTATION TIME; DEVELOPMENT COSTS; EFFECTIVE INDEX; FABRICATION PROCESS; FABRICATION YIELD; KEY PARAMETERS; LOW-SPATIAL FREQUENCY; PHOTONIC WIRES; SHORT-CORRELATION; SIDEWALL ROUGHNESS; SILICON ON INSULATOR; SMALL ROUGHNESS; SPECTRAL RESPONSE; WEAK GRATING APPROXIMATION;

BRAGG GRATINGS; INTEGRATED OPTICS; INTEGRATION; OPTICAL FILTERS;

FABRICATION;

EID: 83455164854     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2011.2173556     Document Type: Article

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