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Advanced Functional Materials

Volumn 21, Issue 21, 2011, Pages 4068-4072

Electronic granularity and the work function of transparent conducting ZnO:Al thin films

(2) Jaramillo, Rafael a Ramanathan, Shriram a

a HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT POTENTIAL; DEFECT CHEMISTRY; ELECTRON TRANSPORT; EMERGING TECHNOLOGIES; GRAIN BOUNDARY OXIDATION; GRANULAR OXIDES; GRANULAR STRUCTURESS; LIGHT EMITTING DEVICES; MACROSCOPIC PROPERTIES; NANO SCALE; NANO-METER-SCALE; OXIDE INTERFACES; PHOTOVOLTAICS; PHYSICAL PICTURES; SCANNING PROBES; TRANSPARENT CONDUCTORS; TRANSPARENT ELECTRODE; VISUAL EVIDENCE; ZNO; ZNO:AL THIN FILMS;

DEFECTS; GRAIN BOUNDARIES; OXIDE FILMS; PHOTOELECTRON SPECTROSCOPY; WORK FUNCTION; ZINC OXIDE;

CONDUCTIVE FILMS;

EID: 82955207184 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201101069 Document Type: Article

Times cited : (20)

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