Development of ultrafast laser flash methods for measuring thermophysical properties of thin films and boundary thermal resistances

Japanese Journal of Applied Physics

Volumn 50, Issue 11 PART 2, 2011, Pages

  Baba, Tetsuya ^a   Taketoshi, Naoyuki ^b   Yagi, Takashi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE VALUES; BULK MATERIALS; COATING FILMS; GEOMETRICAL CONFIGURATIONS; HIGHLY INTEGRATED; INDUSTRIAL TECHNOLOGY; LASER FLASH METHODS; MAGNETO-OPTICAL DISKS; MULTI-LAYERED FILMS; MULTILAYERED THIN FILMS; NANOSECOND PULSE; NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY; NATIONAL METROLOGY INSTITUTE OF JAPANS; ONE-DIMENSIONAL HEAT; OPTICAL DISKS; PHASE CHANGES; PICO-SECOND PULSE; POWER ELECTRONIC DEVICES; PULSED LIGHT; RESPONSE FUNCTION METHOD; SPECIMEN THICKNESS; STANDARD METHOD; THERMO-PHYSICAL PROPERTY; TRANSIENT TEMPERATURE; TRANSPARENT CONDUCTIVE FILMS; ULTRA-FAST;

DATA STORAGE EQUIPMENT; DIFFUSION; ELECTRIC POWER SYSTEMS; FLAT PANEL DISPLAYS; HARD COATINGS; HEAT RESISTANCE; INDUSTRY; LIGHT EMISSION; LIGHT EMITTING DIODES; OPTICAL DISK STORAGE; ORGANIC LASERS; SEMICONDUCTOR DIODES; SEMICONDUCTOR INSULATOR BOUNDARIES; SEMICONDUCTOR LASERS; THERMAL DIFFUSIVITY; THERMODYNAMIC PROPERTIES; THERMOELECTRIC EQUIPMENT; THIN FILMS; ULTRAFAST LASERS;

CONDUCTIVE FILMS;

EID: 82455192752     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.11RA01     Document Type: Conference Paper

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