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Volumn 51, Issue 6, 2008, Pages 382-385
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Analysis of thermal diffusivity for TiNx thin films using thermoreflectance technique
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION;
ELECTRIC CONDUCTIVITY;
ELECTRONS;
HEAT CONDUCTION;
MAGNETRON SPUTTERING;
NITROGEN;
NITROGEN PLASMA;
SUBSTRATES;
THERMAL DIFFUSIVITY;
TITANIUM;
TITANIUM COMPOUNDS;
TITANIUM NITRIDE;
ALKALI FREE GLASS;
DEPOSITION PROCESS;
ELECTRICAL CONDUCTIVITY;
GAS COMPOSITIONS;
NITROGEN COMPOSITION;
REACTIVE RF MAGNETRON SPUTTERING;
STOICHIOMETRIC FILMS;
THERMOREFLECTANCE;
THIN FILMS;
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EID: 50949093546
PISSN: 18822398
EISSN: None
Source Type: Journal
DOI: 10.3131/jvsj2.51.382 Document Type: Article |
Times cited : (2)
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References (15)
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