Grain boundaries between bismuth nanocrystals

Acta Materialia

Volumn 60, Issue 2, 2012, Pages 674-681

  Kowalczyk, P J ^a,b   Belic D ^a   Mahapatra, O ^a   Brown, S A ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

^b UNIVERSITY OF LODZ   (Poland)

Author keywords

Bismuth; Grain boundaries; HR TEM; SEM; STM

Indexed keywords

ATOMIC RESOLUTION; HIGHLY ORIENTED PYROLYTIC GRAPHITE; HR-TEM; LOW RESOLUTION IMAGES; MISORIENTATION ANGLE; STM; SURFACE UNITS;

BISMUTH; DIHEDRAL ANGLE; GRAIN BOUNDARIES; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 81355161027     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.09.041     Document Type: Article

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