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Scripta Materialia

Volumn 45, Issue 4, 2001, Pages 463-469

HRTEM investigation of a Σ = 9 [011̄]/(122) symmetric tilt grain boundary in Cu

(4) Hu, J R a Chang, S C a Chen, F R a Kai, J J a

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

Copper; Grain boundary; Symmetric tilt; Transmission electron microscopy

Indexed keywords

CRYSTAL STRUCTURE; DIFFUSION IN SOLIDS; GRAIN BOUNDARIES; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY;

STACKING FAULT ENERGY (SFE);

COPPER;

EID: 0035979876 PISSN: 13596462 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6462(01)01046-6 Document Type: Article

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.