Microstructure and transport properties of solgel derived highly (100)-oriented lanthanum nickel oxide thin films on SiO2/Si substrate

Journal of Crystal Growth

Volumn 336, Issue 1, 2011, Pages 44-49

  Zhu, M W ^a   Wang, Z J ^a   Chen, Y N ^a   Zhang, Z D ^a  

^a INSTITUTE OF METAL RESEARCH   (China)

Author keywords

A1. Crystal morphology; A1. Pyrolysis step; A3. Epitaxial growth; A3. Solgel; B1. Lanthanum nickel oxide; B2. Electric materials

Indexed keywords

A1. PYROLYSIS STEP; A3. EPITAXIAL GROWTH; A3. SOLGEL; B1. LANTHANUM NICKEL OXIDE; B2. ELECTRIC MATERIALS; CRYSTAL MORPHOLOGIES;

CHEMICAL ANALYSIS; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRIC PROPERTIES; EPITAXIAL GROWTH; FILM GROWTH; LANTHANUM; LANTHANUM ALLOYS; LANTHANUM OXIDES; NICKEL; NICKEL OXIDE; PYROLYSIS; SILICON COMPOUNDS; THIN FILMS; TRANSPORT PROPERTIES;

OXIDE FILMS;

EID: 80155191241     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2011.09.050     Document Type: Article

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