Microstructure and electrical properties of lanthanum nickel oxide thin films deposited by metallo-organic decomposition method

Journal of Crystal Growth

Volumn 290, Issue 1, 2006, Pages 161-165

  Wang, Zhan Jie ^a   Kumagai, Toshihide ^a   Kokawa, Hiroyuki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

A1. Crystal structure; A1. X ray diffraction; B1. Oxides; B2. Electric materials

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; ORGANOMETALLICS; OXIDES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TEMPERATURE; CRYSTALLINE STRUCTURES; METALLO-ORGANIC DECOMPOSITION; PACKED GRAINS;

LANTHANUM COMPOUNDS;

EID: 33645030198     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.01.007     Document Type: Article

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