Growth and characterization of CZT crystals by the vertical bridgman method for X-ray detector applications

IEEE Transactions on Nuclear Science

Volumn 58, Issue 5 PART 2, 2011, Pages 2352-2356

  Zappettini, Andrea ^a   Marchini, Laura ^a   Zha, Mingzheng ^a   Benassi, Giacomo ^a   Zambelli, Nicola ^a   Calestani, Davide ^a   Zanotti, Lucio ^a   Gombia, Enos ^a   Mosca, Roberto ^a   Zanichelli, Massimiliano ^b   Pavesi, Maura ^b   Auricchio, Natalia ^c   Caroli, Ezio ^c  

^a IMEM CNR   (Italy)

^b UNIVERSITY OF PARMA   (Italy)

^c OSSERVATORIO ASTRONOMICO DI BOLOGNA   (Italy)

Author keywords

Boron oxide vertical Bridgman; CdZnTe; mobility lifetime product; vertical Bridgman; X ray detectors

Indexed keywords

BRIDGMAN; CDZNTE; MOBILITY-LIFETIME PRODUCT; VERTICAL BRIDGMAN; X-RAY DETECTOR;

BORON; BORON COMPOUNDS; CADMIUM ALLOYS; CADMIUM COMPOUNDS; CRYSTAL IMPURITIES; CRYSTALS; DETECTORS; EMISSION SPECTROSCOPY; QUARTZ; X RAY APPARATUS; X RAYS;

CRYSTAL GROWTH FROM MELT;

EID: 80054067066     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2011.2163643     Document Type: Article

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